| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_80787665b837ed3eb503bbcd27c0043a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9080d63f8da0a644b6e7b9fcdcf6f306 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-044
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0231
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-103 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-348
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-343
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-48 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-34 |
| filingDate |
1995-03-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e31d03a5ad5e24e3080cd6088ba1a6d7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_79637d6911220673bb32d0864aee89a0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32bbbea709076d3a8d6e1ed9322a1e4c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ccbf2cfaf943fa9eadc9e2715c2819a |
| publicationDate |
1996-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-H08254527-A |
| titleOfInvention |
Ultrasonic flaw detector for inspecting multilayer structure and ultrasonic flaw detection method therefor |
| abstract |
(57) [Summary] [Structure] A first sensor arranged to transmit an ultrasonic wave to a heterogeneous layer surrounded by a medium having different acoustic impedances in a multilayer structure, and a pulsed sine wave is generated. A function generator, a power amplifier for amplifying a pulsed sine wave and inputting it to a first sensor, a second sensor arranged to receive surface echoes of a foreign layer, and a surface received by the second sensor A first amplifier for amplifying the echo; an intensity detecting means for determining the intensity of the amplified surface echo; and a third sensor arranged to receive the echo from a defect in a layer deeper than the foreign layer. A second amplifier for amplifying the defective echo received by the third sensor, a recording device for recording the amplified defective echo, and a control for reading data from the intensity detecting means and issuing a command to the function generator and the recording device. With means Form was. [Effect] It is possible to efficiently detect a defect in the deep layer portion of the multilayer structure. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016090468-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003254943-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017223649-A |
| priorityDate |
1995-03-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |