http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08213439-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5198a2a21392d6cbc0bb4898b3fb3d29
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1995-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b7480643c5a90df78e8bb4691398171
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8a813ff11e9d2457cb2b6983e25b95bd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ac9ff8e7ab1ffaf33332680ceaeda4c8
publicationDate 1996-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08213439-A
titleOfInvention Defect evaluation method for silicon substrate with insulating film
abstract (57) [Summary] (Corrected) [Purpose] To evaluate pinhole defects in a silicon substrate with an insulating film quickly, easily, and accurately. [Structure] Copper is selectively deposited on a pinhole defect 3 of a silicon substrate 1 having an insulating film 2 by an electrochemical reaction, and this precipitation is visually observed to obtain a pinhole defect density. When depositing copper, 0.005 mol / l To an absorbent solid 6 in which an aqueous solution containing 0.04 mol / l of a strong copper salt is impregnated with an electrolyte solution, or a gel containing an electrolyte solution is sandwiched between a copper plate 7 serving as an anode and a silicon substrate serving as a cathode. The absorbent solid or gel is used as an electrolyte that mediates an electrochemical reaction, and is also used as a separator and a support for preventing a short circuit between the anode and the cathode. Therefore, the step of insulating and separating the silicon substrate from the electrolyte solution by an electrochemical cell or the like becomes unnecessary, and the evaluation can be performed easily and quickly.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-0201626-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100476693-B1
priorityDate 1995-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24956
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9794626
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID57448911
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID451110572
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525958
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525490
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID30856
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449188861

Total number of triples: 26.