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filingDate 1995-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a248e9ac1fda821c61ad943941740c5d
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publicationDate 1996-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08176276-A
titleOfInvention Epoxy resin composition for encapsulation and semiconductor device using the same
abstract (57) [Abstract] [PROBLEMS] To provide an encapsulating epoxy resin composition having improved fluidity and moisture resistance reliability after soldering, and a semiconductor device using the encapsulating epoxy resin composition. [Structure] The epoxy resin composition for encapsulation comprises an epoxy resin, a curing agent, and an inorganic powder filler, the epoxy resin contains the epoxy resin of the following formula, and the inorganic powder filler has the following characteristics. Average particle size 18-25μ m, a specific surface area of 2.5 to 3.5 m 2 / g, a particle size of less than 1 μm and a specific surface area of 10 to the whole inorganic powder filler. Molding obtained by compression molding only this inorganic powder filler in a range of 5 to 20% by weight of 20 m 2 / g of inorganic powder filler, and at a pressure at which the average particle size before compression molding is maintained even after compression molding. The volume fraction of the inorganic powder filler in the body is 78 to 90%. The semiconductor device is encapsulated with the encapsulating epoxy resin composition. In the formula, R 1 to R 4 represent hydrogen or an alkyl group, and Gr represents a glycidyl group. Embedded image
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101112043-B1
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priorityDate 1994-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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