http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08153728-A

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filingDate 1994-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21747acfb77b0d181ab4dff0d66658d4
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publicationDate 1996-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08153728-A
titleOfInvention Aluminum wiring processing method
abstract (57) [Summary] [Object] To provide a method for selectively etching a barrier type anodic oxide formed on the surface of aluminum by anodizing the aluminum. [Structure] Halogen fluoride (eg, ClF 3 , Cl Gas etching of the anodic oxide is carried out by exposing the anodic oxide to an atmosphere containing F, BrF 3 , BrF). The etching ends when the aluminum surface is exposed, and a thin aluminum fluoride layer is formed on the aluminum surface, which can be removed by washing with water. By the above method, a metallic aluminum surface can be obtained without overetching.
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priorityDate 1994-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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