http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08130314-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6b822ee046eb6c45d1e3bd9ce9c1782e
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02266
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02282
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0214
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02164
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0217
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31683
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02274
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02258
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-136
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1368
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-522
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 1994-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21747acfb77b0d181ab4dff0d66658d4
publicationDate 1996-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08130314-A
titleOfInvention Method for manufacturing semiconductor device
abstract (57) [Abstract] [Purpose] In a semiconductor device (in particular, a circuit formed on an insulating substrate), an interlayer short circuit caused by a pinhole in an interlayer insulating film is reduced. [Structure] A wiring whose main component is a metal such as aluminum, tantalum, or titanium that easily forms an anodic oxide is formed on an insulating surface, and the wiring is covered to form an interlayer insulator. After that, the substrate is dipped in an electrolytic solution such as ammonium tartrate, and the wiring is used as one of the electrodes to pass a current and gradually increase the potential difference from the opposite electrode, thereby selecting the exposed portion of the wiring due to the pinhole of the interlayer insulator. To form an anodic oxide to enhance the insulating property.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011091352-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011119762-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005142527-A
priorityDate 1994-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID123266
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID2124
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23956
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457707758
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419522015
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24261
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID416641266
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23963
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3084099
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419524341
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559477
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559168
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577792
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID29131
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID451142011
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID2724224

Total number of triples: 47.