http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08124920-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-314
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F4-00
filingDate 1994-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_94b6211ac59ffefeca8c4ac76f127afd
publicationDate 1996-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08124920-A
titleOfInvention Alumite film formation method
abstract (57) [Summary] [Purpose] Even when exposed to plasma, the emission of impurities from the aluminum surface is suppressed, the adhesion of impurities to the wafer surface is prevented, and IC defects are prevented. [Structure] An organic solvent and pure water are used in place of the caustic soda during the degreasing process.
priorityDate 1994-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 21.