http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H07229951-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4af0df9a26ff4aafde7285cbd8eb12f4 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04 |
| filingDate | 1994-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9425f261ce6580b880d59f260140f2f1 |
| publicationDate | 1995-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H07229951-A |
| titleOfInvention | Integrated circuit |
| abstract | (57) [Abstract] [Purpose] It is possible to improve the detection rate of defects that occur during the assembly of the printed circuit board while ensuring the ease of inspecting the logic elements in the integrated circuit. Provided is an integrated circuit in which the propagation delay time of signals is minimized and the influence on the high-speed operation of logic elements is also suppressed. According to the level of the test mode output signal D, a test mode in which a test signal input to the output buffer 20 is output through the tri-state output buffer 21 and a high-level output of the tri-state output buffer 21 are tested. It is possible to perform an inspection by switching to an output high-impedance mode in which the circuit is placed in an impedance state and a test of the circuit at the next stage and thereafter is possible. During normal operation, The short-circuit mechanism 22 is short-circuited and the output signal is output to the output terminal 5 without passing through the tri-state output buffer 21. This minimizes the propagation delay time and enables high speed operation. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7251766-B2 |
| priorityDate | 1994-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 |
Total number of triples: 17.