| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_80787665b837ed3eb503bbcd27c0043a |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822 |
| filingDate |
1993-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_043352a294c17bd65f7780d8c6ceab92
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_90a7c2037c81358bfa07706327d63dcb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_991f4e9ccbed4b3f174deae5e4e7274e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2a876671a8d293ca5e5dcac702a96559 |
| publicationDate |
1995-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-H07128384-A |
| titleOfInvention |
Semiconductor device |
| abstract |
(57) [Abstract] [Purpose] Preventing deterioration of reliability of circuit elements of semiconductor devices due to time-dependent deterioration due to increased usage frequency or surrounding environment [Configuration] Increased usage frequency or due to surrounding environment The semiconductor device 1 having the actual circuit element 2 that deteriorates with time, and the checking circuit element 5 and the checking circuit element 5 that are incorporated in the semiconductor device 1 and have the same laminated structure as the actual circuit element 2 A circuit 6 which applies a load of use of the circuit elements 2 or more, a deterioration progress measuring sensor 7 for measuring the deterioration progress of the checking circuit element 5, and an output terminal 8 connected to the deterioration progress measuring sensor 7. A configured semiconductor device. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014042116-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7469189-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007109322-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019086286-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010203816-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7668682-B2 |
| priorityDate |
1993-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |