http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H07128021-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e6ce91465644f3550d0d342076279107 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-91 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06 |
| filingDate | 1993-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_284677e8eb2b023fc2f6536f20a9b06f |
| publicationDate | 1995-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H07128021-A |
| titleOfInvention | Fine powder laminated film thickness measurement method by film cutting |
| abstract | (57) [Summary] [Purpose] Stable and reliable measurement of fine powder laminated film thickness. [Structure] The method for measuring the fine powder laminated film thickness by film cutting is to prepare a thin and flat glass test piece 1, insert a slit 11 on the surface of the glass test piece 1, and test piece 1 Forming a fine powder layered coating 3 on the surface of the slit 11 of the above, depositing a metal vapor deposition 4 on the coating 3, cutting the slit 11 by applying external force to the test piece 1, cutting test It consists of applying metal vapor deposition 5 to the cut surface 12 of the piece 1 and measuring the film thickness of the cut surface 12 using a microscope. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100919850-B1 |
| priorityDate | 1993-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 31.