| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5547f741b25666fc4ae5195cf71a979b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-13 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01G9-025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01G11-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01G11-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01G9-0036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01G9-042 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G9-052
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G9-028
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G9-025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G9-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G9-00 |
| filingDate |
1993-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_420aad0fce88cdf93994c5e223872f07
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2b64fba7b026c614323f59e996c8ec38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3cbf85c35fe2a95b884af1eb7348c252
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24bf3cd24291ef6ce458a3f67269aa2d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9bc0f78a9fcaafed528d5f72abf52dfd |
| publicationDate |
1995-05-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-H07122464-A |
| titleOfInvention |
Tantalum solid electrolytic capacitor and method of manufacturing the same |
| abstract |
(57) [Abstract] [Purpose] A tantalum solid electrolytic capacitor using a conductive polymer compound as a solid electrolyte, which is less likely to cause failures due to an increase in leakage current when a voltage is applied for a long period of time and has high reliability. An excellent solid electrolytic capacitor is provided. [Structure] Conductive polymer compound 3 has cavities 7 as oxygen supply sources in pores forming the surface of a sintered body (tantalum 1). To leave the dielectric oxide film 2 covered. When a defect 5 occurs in the oxide film 2 and a leakage current flows, oxygen from the cavity 7 changes the conductive polymer compound 3 into an insulator 8 and interrupts the current. The filling rate of the conductive polymer compound in the pores is 70% If it is below, the effect is particularly remarkable. The cavities 7 are formed at a desired filling rate by using chemical oxidative polymerization for forming the conductive polymer compound and repeating the chemical oxidative polymerization. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7872858-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8724294-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4736009-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009010238-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7821772-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006522182-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020084961-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002541659-A |
| priorityDate |
1993-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |