| abstract |
(57) [Abstract] [PROBLEMS] To provide a contour detection system that realizes a contour detection operation in image processing technology in real time without scanning a bias voltage. [Structure] The part surrounded by the broken line is a unit of circuit, Two semiconductor light-receiving elements 1 having symmetrical electrode structures, 2 and a terminal 3 for outputting an electric signal, and two wirings 4 and 5 to which a bias voltage is applied. A plurality of C 11 to C nn are arranged two-dimensionally to form one contour detection system. Each column has a bias voltage of opposite polarity and equal in magnitude, V b, -V b are commonly applied, the unit circuits adjacent to each other are adapted to share a common bias line. No signal appears at the output terminal 3 when there is no light input or when light is input to both the light receiving elements 1 and 2. On the other hand, when the input image has a contour just on this unit circuit, the difference in the light intensity appears at the output terminal 3. |