http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H06194408-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6402b23ab8782152be47b3996e48a4a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822
filingDate 1992-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_531c73b40b51bf5c6547d551360cf068
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80f11c84521ca60302d854f32e2c0449
publicationDate 1994-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H06194408-A
titleOfInvention Semiconductor integrated circuit device
abstract (57) [Summary] [Object] To obtain a semiconductor integrated circuit device capable of individually measuring an input threshold voltage of each input terminal without wiring across an LSI chip. [Structure] Each input buffer I (1, ... N) includes a sample buffer SB (1, ... N), and a potential holding capacitor C that holds an output signal of the sample buffer SB. The signal held here is the holding buffer HB. Corresponding input terminal P (1, ... N) via (1, ... N) Is output to. When the control signal is at the “L” level, the sample buffer SB is driven and the output signal of each input buffer I is held in each potential holding capacitor C. When the control signal becomes the “H” level, the voltage signal held in the potential holding capacitor C is output to each input terminal P via the holding buffer HB.
priorityDate 1992-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310

Total number of triples: 16.