http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H06145843-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d107b35f2512d0630fdf32bb7ab5c994
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C22C14-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C22C5-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1992-11-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f224afc31bc945382b134fbd5dd39dac
publicationDate 1994-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H06145843-A
titleOfInvention Burn-in test device and burn-in test device
abstract (57) [Abstract] [Purpose] At a high temperature of 120 ° C or higher, a defective device can be identified at a glance without confirming the fusing, and thermal damage to non-defective devices, sockets and printed circuit boards can be prevented. A test socket 5 for mounting a semiconductor device to be tested, and a burner which is inserted between the socket 5 and the semiconductor device 6 to be tested and which is detached from the socket by a spring which recovers its shape by environmental temperature. In the in-test element 7, a portion of Pd of a TiPd-based shape memory alloy having a composition in which Ti is 49 to 51 atomic% and the balance is substantially Pd is used as Ni, Cr, Fe, Co, V, It is made of a material obtained by substituting at least one of the group consisting of Mn and W.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3241078-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3241078-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100400065-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018141207-A
priorityDate 1992-11-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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Total number of triples: 19.