http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0579481-U
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3183 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 1992-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1993-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H0579481-U |
| titleOfInvention | LSI tester |
| abstract | (57) [Abstract] [Purpose] The present invention relates to an LSI tester, and its purpose is to By directly measuring the temperature of the part related to the timing accuracy and correcting the timing individually, An object of the present invention is to provide an LSI tester capable of high-speed measurement with a wide operating temperature. In an LSI tester using a multi-chip module in which a plurality of IC chips are mounted, a temperature sensor for measuring the temperature of the mounting surface of each IC chip in each multi-chip module, and an output signal of the temperature sensor based on the temperature sensor A timing correction system for performing timing correction is provided for each IC chip. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-9733370-A1 |
| priorityDate | 1992-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 |
Total number of triples: 14.