http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H05259241-A
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 1992-03-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1993-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H05259241-A |
| titleOfInvention | Wiring board test method |
| abstract | (57) [Summary] [Purpose] An IC with electronic components such as semiconductor devices. The present invention relates to a test method for electrical characteristics of a card, and particularly to provide a test method capable of reliably testing the electrical characteristics of an IC card for a long period of time. In a wiring board testing method for testing the electrical characteristics of a wiring board having a terminal pattern, a contact means in which the direction of the axis is perpendicular to the terminal pattern surface of the wiring board, and the contact means is the axis center thereof. A test jig including a moving means that freely moves in any direction is configured so that the contact means of the test jig is brought into contact with the terminal pattern of the wiring board to test the electrical characteristics of the wiring board. To do. |
| priorityDate | 1992-03-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23925 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491185 |
Total number of triples: 11.