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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-306
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C2-02
filingDate 1992-01-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c31e40d2f34c3c74fcb4852510e87cb2
publicationDate 1993-08-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H05206099-A
titleOfInvention Silicon wafer etching method
abstract (57) [Abstract] [Purpose] It is possible to etch a silicon wafer on which patterns such as aluminum electrodes and gold bumps are formed. In etching a silicon wafer in the manufacture of a semiconductor pressure sensor or the like, a borosilicate glass is anodically bonded to a pattern surface to protect it, so that the silicon wafer is etched without the electrode pattern being attacked by an etching solution.
priorityDate 1992-01-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.