http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H05119118-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6402b23ab8782152be47b3996e48a4a |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 1991-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_28f1e1504e0f965fcd4c37541d31afb7 |
| publicationDate | 1993-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H05119118-A |
| titleOfInvention | Electromigration evaluation board |
| abstract | (57) [Summary] [Object] The present invention relates to an electromigration evaluation board, and identifies a failed chip with a simple system. A plurality of sockets in which a package on which an electromigration evaluation chip is mounted are set are arranged in series, and zener diodes having different zener voltages are connected in parallel to the sockets. |
| priorityDate | 1991-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID28718 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419513094 |
Total number of triples: 12.