http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0499972-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1990-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b8221b3aad4fdd773fcea07e57653766 |
| publicationDate | 1992-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H0499972-A |
| titleOfInvention | Low temperature tester for high speed semiconductor device |
| abstract | PURPOSE: To eliminate contact inferiority or the reflection loss of a signal and to perform a test of good reproducibility by connecting a conversion connector and a cable to the side wall of a container filled with a cooling medium and replacing a semiconductor device in the gaseous atmosphere. of the cooling medium. n CONSTITUTION: A semiconductor device 20 is mounted on a substrate 1 and the cable 15 connected to a measuring device is connected to a conversion connector 3. Next, a cooling medium (liquid nitrogen) 8 is sent into a container 5 through a pipe 12 and a liquid level 9 is raised until the device 20 is perfectly immersed in the cooling medium 8 and, when the device 20 is stabilized at predetermined temp. by a heater 6, a high frequency signal is supplied through the cable 15 to perform a predetermined test. By this method, it is unnecessary to connect and detach the connector 3 and the cable 15 at every test and, since the cable 15 is fixed, contact inferiority, the reflection loss of a signal and the fluctuation of the characteristic impedance of the cable 15 are not generated and a characteristic test of good reproducibility can be conducted. Since the device 2 is mounted and detached in the cooling medium gas, the contact inferiority or current leak due to the condensation of steam can be prevented. n COPYRIGHT: (C)1992,JPO&Japio |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6505471-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007315986-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111366838-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6615605-B2 |
| priorityDate | 1990-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID947 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419556970 |
Total number of triples: 18.