http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0442553-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73ebc284a55d5daf0e209d6186c9e65c
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1990-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6a20ab9a15aa6a1c0737d52e7420cb3e
publicationDate 1992-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H0442553-A
titleOfInvention Semiconductor device
abstract PURPOSE: To obtain a transistor of test pattern enabling accurate measurement of threshold characteristics, in case that a plasma nitride or plasma nitride and oxide film are formed as the final protection film, by providing a structure in which a gate electrode and a third region are electrically connected. n CONSTITUTION: The numeral 7 denotes a P type diffused layer formed within an N type well as a second region, namely a third region having a second conductivity type formed within the second region. The numeral 12 denotes a wiring for electrically connecting a wiring for a gate electrode 8 and a wiring for the P type diffused layer 7 formed within the N type well as the second region 3. This structure is provided within a transistor of test pattern for confirming the basic characteristic. Thereby, even when a plasma nitride is formed or a double-structured layer of an oxide film and plasma nitride is formed as the final protection film, such characteristic irregularity that a threshold voltage of a transistor of the P channel becomes high for the target value but that of the N channel becomes low and fluctuation becomes large can be prevented perfectly. n COPYRIGHT: (C)1992,JPO&Japio
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100249074-B1
priorityDate 1990-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069

Total number of triples: 12.