http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H04361176-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b8ca6ee864e0448264aa0f90630b89c3 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 1991-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_67e2c0e1a656d0ad1c04681b592c908f |
| publicationDate | 1992-12-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H04361176-A |
| titleOfInvention | Ic tester |
| abstract | PURPOSE: To realize an IC tester capable of performing the automatic calibration of the error between pins with extremely high accuracy by excluding an expensive change-over device such as a cable or a coaxial relay large in the number of manufacturing processes. n CONSTITUTION: An amplifier SAMP capable of selectively amplifying the phase difference signal of the output of an own driver and that of the other adjacent driver is provided in pin electronics and the timing edge generation in a timing generating means TG is adjusted so as to minimize the output of the amplifier. The amplifier is constituted of an amplifier utilizing a tuning circuit, a selection level meter or a narrow-band filter. n COPYRIGHT: (C)1992,JPO&Japio |
| priorityDate | 1991-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID426135032 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7156993 |
Total number of triples: 12.