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filingDate 1989-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 1991-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H0334338-A
titleOfInvention Semiconductor device
abstract PURPOSE: To eliminate the fact that a crack is generated in an insulating film or Al scraps are generated even if an alignment at the time of bonding is shifted from the center of the bonding ba a method wherein the side surfaces only of a bonding pad are covered with the insulating film and the insulating film is not made to exist on the bonding pad. n CONSTITUTION: An oxide film 2 is grown on a silicon substrate 1, subsequently an Al film is grown. Then, a bonding pad part is masked with a photoresist 4 and an unnecessary part of the Al film is removed by plasma etching using CCl 4 , for example, to form a bonding pad 3. Then, a plasma nitride film 5 is applied by a plasma CVD method as the resist 4 is left. Then, the whole substrate 1 is dipped into an organic solvent, the resist is made to elute and the film 5 on the resist 4 is removed by a lift-off method. A bonding wire 6 is bonded. n COPYRIGHT: (C)1991,JPO&Japio
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Total number of triples: 28.