http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H03133077-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e80d21c729aa6ff53bc0452132800c04 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R33-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 1989-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_83030d596814797cad1889bb29eb93ae |
publicationDate | 1991-06-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-H03133077-A |
titleOfInvention | Socket for testing ic |
abstract | PURPOSE: To prevent a contact from being deformed by providing a contact comprising a flat plate electrode embedded and fixed in an insulating socket main body, and an external lead connected to the flat plate electrode and extended to the outside from the socket main body. n CONSTITUTION: A flat plate electrode 2 whose surface of copper or copper alloy plate is plated with gold is embedded and fixed in a socket main body 1 molded from ceramics or ABC resin etc. in such a manner that the upper face of the flat electrode 2 is exposed to the outside. An external lead 3 connected to the flat electrode 2 is passed through the socket main body 1 and is guided to the outside. The lead 6 of an IC5 to be tested is placed on the flat place electrode 2 and is pressed into contact with the electrode 2 from above by a lead pusher 4 with specified pressure and then the IC5 is tested. Deformation of the contact is thus prevented against even a large external force. n COPYRIGHT: (C)1991,JPO&Japio |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030017759-A |
priorityDate | 1989-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.