http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H03131737-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-00
filingDate 1989-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f33d6f78260869f56c7483c9c18a3c37
publicationDate 1991-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H03131737-A
titleOfInvention Inspecting device for semiconductor laser
abstract PURPOSE: To improve the quality guarantee by inserting a Peltier element between a chip sucking mechanism and a water cooling plate. n CONSTITUTION: The Peltier element 13 is inserted between the chip sucking mechanism 12 and water cooling plate 14, so the generated heating value of the element 13 is absorbed by a heat exchanger 15 to perform stable inspection for a long time over a wide -20 - 100°C temperature range. Further, a heat insulating spacer 17 cuts off heat conducted to a positioning mechanism 16. Also, the water cooling plate 14 and heat exchanger 15 are used to preclude dew condensation on a radiation side when the mechanism 12 is exposed to high temperature and also prevent the element from breaking when the mechanism 12 is returned to room temperature from the high temperature. Thus, laser characteristics at the high temperature above element temperature- threshold temperature can be evaluated and a chip with excellent characteristics can be selected even in high-temperature operation, so the quality guarantee of the product can be improved. n COPYRIGHT: (C)1991,JPO&Japio
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5703893-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009092489-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11233872-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002043671-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018066578-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003329725-A
priorityDate 1989-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962

Total number of triples: 21.