| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-213
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8427
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-4126 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09D171-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08G65-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B21-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08G65-007
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B1-111
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-211
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J4-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-30 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08G65-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-49
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41 |
| filingDate |
2020-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2022-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2022-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-7188600-B2 |
| titleOfInvention |
Method for measuring optical constants of thin films of fluorine-containing organosilicon compounds |
| priorityDate |
2019-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |