http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-6971082-B2
Outgoing Links
Predicate | Object |
---|---|
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2017-08-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2021-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-6971082-B2 |
titleOfInvention | Semiconductor device inspection method, semiconductor device manufacturing method, and inspection device |
priorityDate | 2017-08-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
---|---|
isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9863 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549006 |
Total number of triples: 11.