http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-6574104-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-308 |
| filingDate | 2015-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2019-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-6574104-B2 |
| titleOfInvention | Nitride-based semiconductor etching method and nitride-based semiconductor crystal defect detection method |
| priorityDate | 2015-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.