| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L25-0657 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F1-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31715
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318513
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-32 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate |
2014-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2018-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2018-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-6428210-B2 |
| titleOfInvention |
Semiconductor device and method for testing semiconductor device |
| priorityDate |
2014-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |