Predicate |
Object |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-02 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2000-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2011-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2011-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-4789308-B2 |
titleOfInvention |
Test power supply circuit for semiconductor devices |
priorityDate |
1999-07-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |