Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-0044 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2004 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-225 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-30 |
filingDate |
2007-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2010-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2010-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-4581100-B2 |
titleOfInvention |
Preparation method of specimen for electron microscope, sample observation method using the same, and sample observation apparatus |
priorityDate |
2006-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |