| Predicate |
Object |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-022
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate |
1999-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2008-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2008-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-4036554-B2 |
| titleOfInvention |
Semiconductor device, test method thereof, and semiconductor integrated circuit |
| priorityDate |
1999-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |