| Predicate |
Object |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318536
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318572
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3172
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318541 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-82
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-0175
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-317
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04 |
| filingDate |
2003-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2005-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2005-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-3632691-B2 |
| titleOfInvention |
Test circuit, integrated circuit, and test method |
| priorityDate |
2003-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |