http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-3500834-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-326 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1996-02-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2004-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2004-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-3500834-B2 |
| titleOfInvention | Semiconductor test equipment |
| priorityDate | 1996-02-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419583196 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID104727 |
Total number of triples: 13.