http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-3120796-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate | 1998-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2000-12-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2000-12-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-3120796-B2 |
| titleOfInvention | Method of manufacturing contact probe for electrical inspection |
| priorityDate | 1998-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 41.