http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2729736-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B7-06 |
| filingDate | 1992-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1998-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1998-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2729736-B2 |
| titleOfInvention | Apparatus for measuring thin film thickness |
| priorityDate | 1992-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 14.