http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2662983-B2
Outgoing Links
Predicate | Object |
---|---|
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3183 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
filingDate | 1988-06-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 1997-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 1997-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2662983-B2 |
titleOfInvention | Timing calibration method for IC test equipment |
priorityDate | 1988-06-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
---|---|
isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID447684039 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID90479729 |
Total number of triples: 11.