http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2584414-Y2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1991-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1998-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1998-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2584414-Y2 |
| titleOfInvention | Test equipment for semiconductor devices |
| priorityDate | 1991-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23931 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419556032 |
Total number of triples: 11.