http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2558819-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22 |
| filingDate | 1988-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1996-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1996-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2558819-B2 |
| titleOfInvention | Multi-pin LSI with test circuit for soldering defect inspection |
| priorityDate | 1988-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 |
Total number of triples: 13.