http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2022518429-A
Outgoing Links
Predicate | Object |
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classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K2201-061 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-0565 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K2201-068 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-102 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K2201-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K2201-062 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05G2-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05G2-008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21K1-062 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S4-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S3-0903 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05H13-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S3-30 |
filingDate | 2020-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2022-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2022518429-A |
titleOfInvention | Electron diffraction intensity from single crystal silicon in photoinjector |
abstract | The method involves simulating diffraction in the transmission geometry of a relativistic electron bunch from the crystal structure of a crystal, thereby simulating the diffraction of a relativistic electron bunch to multiple Bragg peaks. The method comprises selecting a range of angles between the propagation direction of the relativistic electron bunch and the normal direction of the crystal, including the angle at which the diffraction moiety is maximized. The method is to sequentially accelerate multiple physical electron bunches toward a physical crystal having a crystal structure to relativistic energy, and to diffract multiple physical electron bunches from the physical crystal at different angles. Including measuring the diffracted portion to each Bragg peak in. The method comprises selecting the final angle based on the measured diffraction portion to each Bragg peak at different angles and generating a pulse of light. [Selection diagram] FIG. 1A |
priorityDate | 2019-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 42.