| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b4c29c13b4ad00d7e017ff761c108d65 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-0214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-071
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-001
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-337
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2884
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-333
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3171
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04B10-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31728
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-04 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04B10-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04B10-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2020-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_55caeb471c25b474992557e66c10de4b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e743facddeae951ec92a5e37bc2fc80
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed56410b955accd97edfd6ead58d41a5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89e2f232a23b6c51b33d14d9f3957904
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e00d3e2f1b4b5b69c7826420e40903e |
| publicationDate |
2022-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2022027372-A |
| titleOfInvention |
Hybrid automated test equipment for testing optical and electrical devices |
| abstract |
PROBLEM TO BE SOLVED: To provide rapid testing and calibration of some modern hybrid high-speed devices such as optical transceivers which process both electricity and light to achieve higher data rates. SOLUTION: A hybrid optical electric automatic test equipment (ATE) system 100 can realize an optical test assembly 130 including an electric interface and an optical interface with an optical electric test device 120. The optical test assembly 130 can include a socket 123 in which the device 120 is placed so as to connect to electrical and optical connections by the ATE system 100. The optical connection 140 can couple light to one or more test devices through the socket 123 and the optical test assembly 130 to perform effective testing of optical devices such as high speed optical transceivers. [Selection diagram] Fig. 1 |
| priorityDate |
2020-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |