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filingDate 2019-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2021-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2021510449-A
titleOfInvention X-ray metering system with broadband laser-produced plasma illuminator
abstract An X-ray-based semiconductor weighing method and system utilizing a broadband soft X-ray illumination source is described herein. A laser-produced plasma (LPP) light source produces high-intensity broadband soft X-ray illumination. The LPP light source directs a high-focus, short-duration laser light source to a liquid or solid non-metal droplet target. In one example, the droplet generator ejects a row of nominal 50 μm droplets of feed material at a rate of 50-400 kHz. In some embodiments, the duration of each excitation light pulse is less than 1 nsec. In some embodiments, the duration of each excitation light pulse is less than 0.5 nsec. In some embodiments, the LPP light source has a gas separation system that separates the unconsumed feed material from other gases in the plasma chamber and resupplyes the separated feed material to the droplet generator.
priorityDate 2018-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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