http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020526737-A

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filingDate 2018-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2020-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2020526737-A
titleOfInvention Cryogenic electron microscope gas phase sample preparation
abstract The present invention provides a method for controllingly forming layers of amorphous ice and other amorphous solids on a substrate, and a method for preparing a low temperature electron microscope (low temperature EM) sample utilizing the formation of amorphous ice and other solids in vacuum. And also provide a system. The formation of an amorphous solid layer can be independent of the deposition of sample molecules to be analyzed using an electron microscope, allowing the formation of layers of uniform thickness. Optionally, a mass spectrometer is used to generate and purify the molecules deposited on the resulting amorphous solid layer. The techniques and systems described herein are near-ideal cold EMs for improving the resolution, sensitivity, field of view, and throughput of cold EM protein imaging, and thus for significant impact in the field of structural biology. Sample preparation can be provided. [Selection diagram] Fig. 1
priorityDate 2017-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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