http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020187102-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7af673589ca45d2fd8b9ea902cdbd1dc
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2019-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d1df9cfd6fb42790453109b53599b9b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3995d524453308b0e1ae4115b971cbb3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c0312d2ab548059b8e0b5fb8ad6dcbbc
publicationDate 2020-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2020187102-A
titleOfInvention Inspection method and inspection equipment for semiconductor devices
abstract PROBLEM TO BE SOLVED: To provide a novel inspection method for inspecting the characteristics of a semiconductor device. SOLUTION: When an inspection method of a semiconductor device in which a switching element having a gate electrode 18 is formed on a silicon carbide semiconductor substrate 10 is performed, a parasitic diode 21 configured in the switching element is subjected to a forward direction in terms of use conditions. Based on the pulse current, the temperature of the parasitic diode 22 is derived from the forward voltage of the parasitic diode 22 when the pulse current is flowing through the parasitic diode 22, and the derived temperature is assumed to be the parasitic diode 22. The pulse current flowing through the parasitic diode 22 is adjusted so that the temperature is lower than the threshold temperature based on the usage conditions, and the characteristics of the switching element are inspected. [Selection diagram] Fig. 2
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022202076-A1
priorityDate 2019-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549006
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9863

Total number of triples: 19.