http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020167069-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f1192a135e4bc40a5f201a9646f20172 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c58adf7ff4da9ab69bcd00caccaf3aee |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02J7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-367 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-0562 |
filingDate | 2019-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0538ee4cf6882023ae087cad72120aa4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c05f8c05809b280e7f79e9e9217399e9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_09880e3d564489a09fdc2bc22cf4932c |
publicationDate | 2020-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2020167069-A |
titleOfInvention | Internal short-circuit state estimation device and internal short-circuit state estimation method for all-solid-state lithium-ion secondary battery, and charging device for all-solid-state lithium-ion secondary battery system and all-solid-state lithium-ion secondary battery. |
abstract | PROBLEM TO BE SOLVED: To provide a means for predicting the occurrence of an internal short circuit in an all-solid-state lithium ion secondary battery in advance. SOLUTION: An electrolyte resistance component and a reaction resistance component are calculated from AC impedance and plotted on plane coordinates composed of two axial components to obtain internal resistance coordinates of the all-solid-state lithium ion secondary battery. The presence or absence of the possibility of internal short circuit is estimated by comparing with the map including the internal short circuit plot in which the internal short circuit occurred and the normal plot in which the internal short circuit did not occur obtained by using the equivalent reference battery in advance. At this time, when it is estimated that the internal short circuit has not occurred by comparing the internal resistance coordinates acquired in this calculation with the map and there is no possibility of the internal short circuit, it was acquired in the previous calculation. If the internal resistance coordinates exist, an approximate straight line is obtained by using the internal resistance coordinates acquired this time, and the possibility of an internal short circuit is estimated based on the slope of the straight line. [Selection diagram] Fig. 6 |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113791364-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113359047-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023118960-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113359047-A |
priorityDate | 2019-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 53.