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publicationDate 2020-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2020088283-A
titleOfInvention Test wafer and manufacturing method thereof
abstract PROBLEM TO BE SOLVED: To provide a test wafer capable of imitating the heat generation of an actual device and a manufacturing method thereof. Kind Code: A1 A test wafer for imitating heat generation of a device on a wafer, which has a silicon wafer and a silicon heater bonded to the surface of the silicon wafer. [Selection diagram] Figure 1
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Total number of triples: 32.