http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020056794-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fdf3b6ced3d7710ec0bc0addb67a1cc9 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786 |
| filingDate | 2019-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_66ae1944f4d1be63a77b686e5a6cc529 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_074136c7a0ddcd4d92350072cf821718 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_873ca0fa376433ff85d7160b990738a8 |
| publicationDate | 2020-04-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2020056794-A |
| titleOfInvention | Current measurement method |
| abstract | A current measurement method capable of measuring a minute current is provided. A first potential is supplied to a gate of a transistor under test, and a first terminal of the transistor under test and a node electrically connected to the first terminal of the first transistor are connected to a first terminal. The first transistor is turned off, the first transistor is turned off, the second potential of the output terminal of the read circuit electrically connected to the node, and the first potential are periodically measured. A time series of a value obtained by subtracting the first potential from the second potential is created, and the current value of the transistor under test is calculated from the slope of the time series. [Selection diagram] Fig. 1 |
| priorityDate | 2014-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 45.