http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019197872-A

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filingDate 2018-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2019-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2019197872-A
titleOfInvention Semiconductor film forming method and film forming apparatus
abstract A technique capable of forming a semiconductor film with favorable embedding characteristics with high productivity is provided. A method of forming a semiconductor film according to one embodiment of the present disclosure includes forming a semiconductor film in the recess by supplying a semiconductor source gas to a substrate having a recess formed on a surface and the recess is covered with an insulating film. A first step of supplying a halogen-containing etching gas to the substrate to expose the surface of the insulating film above the inner wall of the recess, and etching the semiconductor film so that the semiconductor film remains on the bottom surface of the recess After the second step and after the second step, a halogen-containing semiconductor gas and a hydrogenated semiconductor gas are simultaneously supplied to the substrate to form a semiconductor film on the semiconductor film remaining on the bottom surface of the recess. And a third step. [Selection] Figure 1
priorityDate 2018-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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