http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018179827-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2017-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_edbaf99ac0c4a149dd7fe9376b4093de
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d0b11c5032bc11799d2f5172ba516d84
publicationDate 2018-11-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2018179827-A
titleOfInvention Test equipment
abstract The present invention provides a test apparatus capable of bringing a probe into contact with an inspection target while suppressing breakage of the probe and without breaking the impedance matching. A test apparatus (1) includes a probe unit (11) having probes (P1, P2, P3), and a jig (40). The jig (40) includes a fixing unit (41) configured to be able to adjust the position in the Z-axis direction (vertical direction), an operation unit (42) to which the probe unit (11) is fixed, and an operation unit (42). And the coil spring (44) connected to the fixed portion (41) and the operating portion (42). . [Selected figure] Figure 3
priorityDate 2017-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557764
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID31170

Total number of triples: 15.