http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018063251-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_60e66be87630d7cef0ce770e1d898eec http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_388f51184566065bdf266df44d6dbd5f |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-2202 |
| filingDate | 2017-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ae86b4b148fd08ceb7015df556a178ef http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_edc50c2608f55889e5c7fae5e766dcd7 |
| publicationDate | 2018-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2018063251-A |
| titleOfInvention | Sample analysis method |
| abstract | An object of the present invention is to provide a sample analysis method capable of easily analyzing an element contained in a sample with high accuracy by removing a heterogeneous effect. A method for analyzing a sample, in which a flux and a sample are simultaneously heated with a laser beam to vitrify, the sample is cooled, and the vitrified region is irradiated with X-rays. And identifying the element contained in the substance based on the intensity of the emitted fluorescent X-ray. [Selection] Figure 1 |
| priorityDate | 2016-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.