http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017532536-A

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G05B2219-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G05B1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-085
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B64D41-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B64F5-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02
filingDate 2015-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2017-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2017532536-A
titleOfInvention Locating electrical faults in the circuit
abstract The present invention relates to locating an electrical fault (61) in an electrical circuit (50), and more particularly to an electrical fault (61) in a transmission line (60) of the electrical circuit (50). Embodiments of the present invention open the switch (90) in the electrical circuit (50) to create an open circuit or discontinuity at the fault (61) and open circuit or to determine the location of the fault. Methods and apparatus are provided for transmitting (100) signals reflected from discontinuities (100) and receiving signals reflected from open circuits or discontinuities (100). Embodiments of the present invention are particularly suitable for high voltage systems, eg, greater than 100V. [Selection] Figure 2
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2021210124-A1
priorityDate 2014-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID37542
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419507729

Total number of triples: 19.