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filingDate 2015-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2017-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2017526167-A
titleOfInvention Apparatus and method for nanoprobing of electronic devices
abstract A method for probing a semiconductor device under test (DUT) by a combination of a nanoprobe and a scanning electron microscope (SEM), comprising obtaining a SEM image of a region of interest (ROI) in a DUT, Obtaining a step; Aligning the CAD design image with the SEM image to identify the contact target, and a netlist corresponding to the contact target is obtained to determine which contact target should be selected as the test target. Using a netlist and landing a nanoprobe on each of the test targets and navigating the nanoprobe to form electrical contacts between each of the nanoprobe and the test target. [Selection] Figure 1
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